Spire Receives DOE Contract to Develop a Microcrack Detection Technique for Silicon Solar Cells & Wafers
Nov 4, 2008 – Spire Corporation (Nasdaq: SPIR), a company providing turnkey solar factories and capital equipment to manufacture photovoltaic (PV) modules and cells, announced that it has received a contract from the US Department of Energy (DOE) to develop a microcrack detection technique for silicon solar cells 
and wafers. This automated diagnostic system will enable solar cell and module manufacturers to significantly reduce the cost and improve the reliability of their PV modules.
This press release did not help Spire’s stock price as it dropped over 6% during an up day on the stock market. Within the last year Spire’s stock has been over $26 and today it is under $8. Once again, investors want to see growing revenues and income.
Both mono- and multi-crystalline solar cells and wafers occasionally contain microcracks that are difficult or impossible to detect by visual inspection. These cracks can propagate during module assembly or after installation, resulting in cell breakage and module power loss. Spire will investigate a microcrack detection technique that can be used as an in-process diagnostic method for identifying defective crystalline silicon wafers or solar cells in a production line. This new diagnostic capability will enable solar cell and module manufacturers to reduce labor requirements for inspection and rework, increase production yields, and improve module reliability and lifetime in the field.
